Altana Micro-Wave-Scan Manual Manual de usuario Pagina 41

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AdvancedConguration
10.AdvancedConguration
10.1 Correction
Defects on the sample surface, such as scratches
or craters, can cause major errors in measurement
values. When Correction is activated, the affected
scan areas are cut out and the measurement
values are calculated from the sanitized data.
Pressing“operate”turnsCorrectiononandoff.
10.2 Plausibility Control
An option for comparing the corrected and
uncorrected measurement value. The greater the
difference between the corrected and uncorrected
data,themorecriticalisthesurfacedefect.Ifthe
difference is greater than 20 %, the measurement
will be evaluated as a faulty measurement. An
error message appears and a new measurement is
then needed.
Pressing“operate”turnsPlausibilityControlonand
off.
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